Journal of
Systemics, Cybernetics and Informatics
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ISSN: 1690-4524 (Online)


Peer Reviewed Journal via three different mandatory reviewing processes, since 2006, and, from September 2020, a fourth mandatory peer-editing has been added.

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Published by
The International Institute of Informatics and Cybernetics


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Academia.edu
(A Community of about 40.000.000 Academics)


Honorary Editorial Advisory Board's Chair
William Lesso (1931-2015)

Editor-in-Chief
Nagib C. Callaos


Sponsored by
The International Institute of
Informatics and Systemics

www.iiis.org
 

Editorial Advisory Board

Quality Assurance

Editors

Journal's Reviewers
Call for Special Articles
 

Description and Aims

Submission of Articles

Areas and Subareas

Information to Contributors

Editorial Peer Review Methodology

Integrating Reviewing Processes


Education 5.0: Using the Design Thinking Process – An Interdisciplinary View
Birgit Oberer, Alptekin Erkollar
(pages: 1-17)

Impact of Artificial Intelligence on Smart Cities
Mohammad Ilyas
(pages: 18-39)

A Multi-Disciplinary Cybernetic Approach to Pedagogic Excellence
Russell Jay Hendel
(pages: 40-63)

Data Management Sharing Plan: Fostering Effective Trans-Disciplinary Communication in Collaborative Research
Cristo Ernesto Yáñez León, James Lipuma
(pages: 64-79)

From Disunity to Synergy: Transdisciplinarity in HR Trends
Olga Bernikova, Daria Frolova
(pages: 80-92)

The Impact of Artificial Intelligence on the Future Business World
Hebah Y. AlQato
(pages: 93-104)

Wi-Fi and the Wisdom Exchange: The Role of Lived Experience in the Age of AI
Teresa H. Langness
(pages: 105-113)

Older Adult Online Learning during COVID-19 in Taiwan: Based on Teachers' Perspective
Ya-Hui Lee, Yi-Fen Wang, Hsien-Ta Cha
(pages: 114-129)

Data Visualization of Budgeting Assumptions: An Illustrative Case of Trans-disciplinary Applied Knowledge
Carol E. Cuthbert, Noel J. Pears, Karen Bradshaw
(pages: 130-149)

The Importance of Defining Cybersecurity from a Transdisciplinary Approach
Bilquis Ferdousi
(pages: 150-164)

ChatGPT, Metaverses and the Future of Transdisciplinary Communication
Jasmin (Bey) Cowin
(pages: 165-178)

Trans-Disciplinary Communication for Policy Making: A Reflective Activity Study
Cristo Leon
(pages: 179-192)

Trans-Disciplinary Communication in Collaborative Co-Design for Knowledge Sharing
James Lipuma, Cristo Leon
(pages: 193-210)

Digital Games in Education: An Interdisciplinary View
Birgit Oberer, Alptekin Erkollar
(pages: 211-230)

Disciplinary Inbreeding or Disciplinary Integration?
Nagib Callaos
(pages: 231-281)


 

Abstracts

 


ABSTRACT


Material Discriminated X-Ray CT System by Using New X-Ray Imager with Energy Discriminate Function

Toru Aoki, Takuya Nakashima, Hisashi Morii, Yoichiro Neo, Hidenori Mimura


Material discriminated X-ray CT system has been constructed by using conventional X-ray tube (white X-ray source) and photon-counting X-ray imager as an application with energy band detection. We have already reported material identify X-ray CT using K-shell edge method elsewhere. In this report the principle of material discrimination was adapted the separation of electron-density and atomic number from attenuation coefficient mapping in X-ray CT reconstructed image in two wavelength X-ray CT method using white X-ray source and energy discriminated X-ray imager by using two monochrome X-ray source method. The measurement phantom was prepared as four kinds material rods (Carbon(C), Iron(Fe), Copper(Cu), Titanium(Ti) rods of 3mm-diameter) inside an aluminum(Al) rod of 20mm-diameter. We could observed material discriminated X-ray CT reconstructed image, however, the discrimination properties were not good than two monochrome X-ray CT method. This results was could be explained because X-ray scattering, beam-hardening and so on based on white X-ray source, which could not observe in two monochrome X-ray CT method. However, since our developed CdTe imager can be detect five energy-bands at the same time, we can use multi-band analysis to decrease the least square error margin. We will be able to obtain more high separation in atomic number mapping in X-ray CT reconstructed image by using this system.

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