Journal of
Systemics, Cybernetics and Informatics
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ISSN: 1690-4524 (Online)


Peer Reviewed Journal via three different mandatory reviewing processes, since 2006, and, from September 2020, a fourth mandatory peer-editing has been added.

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Published by
The International Institute of Informatics and Cybernetics


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Honorary Editorial Advisory Board's Chair
William Lesso (1931-2015)

Editor-in-Chief
Nagib C. Callaos


Sponsored by
The International Institute of
Informatics and Systemics

www.iiis.org
 

Editorial Advisory Board

Quality Assurance

Editors

Journal's Reviewers
Call for Special Articles
 

Description and Aims

Submission of Articles

Areas and Subareas

Information to Contributors

Editorial Peer Review Methodology

Integrating Reviewing Processes


Transfer Learning for Facial Emotion Recognition on Small Datasets
Paolo Barile, Clara Bassano, Paolo Piciocchi
(pages: 1-5)

How to Link Educational Purposes and Immersive Video Games Development? An Ontological Approach Proposal
Nathan Aky
(pages: 6-13)

Application of Building Information Modeling (BIM) in the Planning and Construction of a Building
Renata Maria Abrantes Baracho, Luiz Gustavo da Silva Santiago, Antonio Tagore Assumpção Mendoza e Silva, Marcelo Franco Porto
(pages: 14-19)

Transformative, Transdisciplinary, Transcendent Digital Education: Synergy, Sustainability and Calamity
Rusudan Makhachashvili, Ivan Semenist
(pages: 20-27)

New Online Tools for the Data Visualization of Bivalve Molluscs' Production Areas of Veneto Region
Eleonora Franzago, Claudia Casarotto, Matteo Trolese, Marica Toson, Mirko Ruzza, Manuela Dalla Pozza, Grazia Manca, Giuseppe Arcangeli, Nicola Ferrè, Laura Bille
(pages: 28-32)

Geodata Processing Methodology on GIS Platforms When Creating Spatial Development Plans of Territorial Communities: Case of Ukraine
Olena Kopishynska, Yurii Utkin, Ihor Sliusar, Leonid Flehantov, Mykola Somych, Oksana Yakovlieva, Olena Scryl
(pages: 33-40)

D-CIDE: An Interactive Code Learning Program
Lukas Grant, Matthew F. Tennyson, Jason Owen
(pages: 41-46)

Interdisciplinary Digital Skills Development for Educational Communication: Emergency and Ai-Enhanced Digitization
Rusudan Makhachashvili, Ivan Semenist, Ganna Prihodko, Irina Kolegaeva, Olexandra Prykhodchenko, Olena Tupakhina
(pages: 47-51)

Interdisciplinarity in Smart Systems Applied to Rural School Transport in Brazil
Renata Maria Abrantes Baracho, Mozart Joaquim Magalhães Vidigal, Marcelo Franco Porto, Beatriz Couto
(pages: 52-59)

Peculiarities of the Realization of IT Projects for the Implementation of ERP Systems on the Path of Digitalization of Territorial Communities Activities
Olena Kopishynska, Yurii Utkin, Ihor Sliusar, Khanlar Makhmudov, Olena Kalashnyk, Svitlana Moroz, Olena Kyrychenko
(pages: 60-67)


 

Abstracts

 


ABSTRACT


Material Discriminated X-Ray CT System by Using New X-Ray Imager with Energy Discriminate Function

Toru Aoki, Takuya Nakashima, Hisashi Morii, Yoichiro Neo, Hidenori Mimura


Material discriminated X-ray CT system has been constructed by using conventional X-ray tube (white X-ray source) and photon-counting X-ray imager as an application with energy band detection. We have already reported material identify X-ray CT using K-shell edge method elsewhere. In this report the principle of material discrimination was adapted the separation of electron-density and atomic number from attenuation coefficient mapping in X-ray CT reconstructed image in two wavelength X-ray CT method using white X-ray source and energy discriminated X-ray imager by using two monochrome X-ray source method. The measurement phantom was prepared as four kinds material rods (Carbon(C), Iron(Fe), Copper(Cu), Titanium(Ti) rods of 3mm-diameter) inside an aluminum(Al) rod of 20mm-diameter. We could observed material discriminated X-ray CT reconstructed image, however, the discrimination properties were not good than two monochrome X-ray CT method. This results was could be explained because X-ray scattering, beam-hardening and so on based on white X-ray source, which could not observe in two monochrome X-ray CT method. However, since our developed CdTe imager can be detect five energy-bands at the same time, we can use multi-band analysis to decrease the least square error margin. We will be able to obtain more high separation in atomic number mapping in X-ray CT reconstructed image by using this system.

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